Benchtop spectrophotometer TS8216-3NH

Benchtop spectrophotometer TS8216

Unleash Precision Color Analysis for Ultimate Quality Control

The TS8216 spectrophotometer is a high-precision color measurement instrument designed for industrial quality control and color management. Spectrophotometers serve critical roles in standard development, color formulation, and quality assurance across diverse industries—automotive, paints & coatings, plastics, textiles & apparel, cosmetics, paper, building materials, food & beverage, and beyond.

Key Highlights

256-element linear CCD sensor
Reflection and Transmission test
Industrial-grade 7-inch high-definition touch screen
D/8 geometry (SCI/SCE) complies with international standards (CIE No.15, ASTM E1164, etc.)
Excellent repeatability (ΔEab ≤0.01) and inter-instrument agreement (ΔEab ≤0.12)
Integrates with PC software for data analysis and management

Benchtop spectrophotometer TS8216 Instructions Operating Manual Benchtop spectrophotometer TS8216 PDF

This TS8216 Instrument are Certified with

1 Years Warranty (Additional support period of 3 years)

The benchtop spectrophotometer TS8216 is a spectrophotometer developed by 3nh using its own core technology of spectroscopy. It uses a dual-array CMOS image sensor with higher sensitivity and a wider spectral response range, and the test is more accurate. The repeatability ΔE*ab of the TS8216 benchtop spectrophotometer is easily controlled within 0.01, and the inter-instrument errorΔE*ab is controlled within 0.12. The data is stable and reliable, and can be used for accurate color analysis and transmission in the laboratory.

Features of TS8216 Benchtop Spectrophotometer

Micropore aperture

TS8216 benchtop spectrophotometer provides reflection: Φ0.3mm/Φ0.5mm/Φ1mm (only choose one aperture) Transmission: Φ8mm/Φ4mm (only choose one aperture), used for small area reflection samples and small volume transmission samples chromaticity control.

D/8 structure, SCI/SCE and supports SCI+SCE rapid measurement at the same time

The TS8216 benchtop spectrophotometer adopts the internationally applicable D/8 illumination observation conditions, SCI/SCE (including specular reflection/not including specular reflection) synthesis technology, and supports SCI+SCE simultaneous rapid measurement.

Dual array CMOS image sensor

With high sensitivity and wide spectral response range, it ensures the measurement speed, accuracy, stability and consistency of the instrument.

Multiple color measurement spaces, multiple observation light sources

TS8216 benchtop spectrophotometer provides CIE LAB, XYZ, Yxy, LCh, CIE LUV, Musell, s-RGB, HunterLab, βxy, DIN Lab99 color space, as well as D65,A,C,D50,D55,D75,F1,F2,F3,F4,F5,F6,F7,F8,F9,F10,F11,F12,CWF,DLF,TL83,TL84,TPL5,U30 multiple observation light sources, which can meet the special measurement requirements under different measurement conditions.

Adopt a combined full-spectrum LED light source and UV light source

The full-band balanced LED light source ensures sufficient spectral distribution in the visible light range, avoids the lack of spectrum of white light LEDs in specific wavelength bands, and ensures the measurement speed of the instrument and the accuracy of the measurement results. Professional UV light sources ensure UV testing more reliable.

Industrial-grade high-definition touch screen, easy-to-use user interface

Using a 7-inch industrial-grade high-definition touch screen, the control is smooth, and the easy-to-use user interface makes the operation comfortable, convenient and easier to use.

Color management software

The SQCX quality management software matched with the TS8216 benchtop spectrophotometer is suitable for quality monitoring and color data management in various industries. Data the user's color management, compare color differences, generate test reports, provide a variety of color space measurement data, and customize customer color management.

Contact Request for TS8216 Benchtop Spectrophotometer

Are you looking to integrate one or more benchtop spectrophotometer into your business applications? Do you need advice or simply a quote? We invite you to contact us directly by filling out the request form below. Our sales and technical team is available to respond as quickly as possible.

Technical Parameters of TS8216 Benchtop Spectrophotometer

Model	TS8216
Optical Geometry	Reflect: di:8°, de:8°((diffuse illumination, 8°direction reception) ;
	SCI (specular component included)/SCE (specular component excluded) ;Include UV/exclud UV
	Transmittance: di:0°, de:0° (diffuse illumination: 0°direction reception) ;
	SCI (specular component included)/SCE (specular component excluded) ; Include UV/exclud UV
	Haze(ASTM D1003),
	Conforms to CIE No.15，GB/T 3978,GB 2893,GB/T 18833,ISO7724/1,ASTM E1164,DIN5033 Teil7
Application	It is used for the color control of small-area reflective samples and small-volume transmission samples.
Integrating Sphere Size	Φ154mm
Light Source	360 nm to 780 nm, Combined LED Light, 400nm cut-off light source,420nm cut-off light source
Spectrophotometric Mode	Concave Grating
Sensor	256 Image Element Double Array CMOS Image Sensor
Wavelength Range	360-780nm
Wavelength Interval	10nm
Semiband Width	5nm
Measured Reflectance Range	0-200%
Measuring Aperture	Reflective : Φ0.3mm/Φ0.5mm/Φ1mm (only choose one aperture)
	Transmissive : Φ8mm/Φ4mm (only choose one aperture)
Specular Component	Reflectance: SCI/SCE, Transmittance: SCI/SCE
Color Space	CIE LAB,XYZ,Yxy,LCh,CIE LUV,Musell,s-RGB,HunterLab,βxy,DIN Lab99
Color Difference Formula	ΔEab,ΔEuv,ΔE94 ,ΔEcmc(2:1),ΔEcmc(1:1) ,ΔE00, DINΔE99, ΔE(Hunter)
Other Colorimetric Index	WI (ASTM E313, CIE/ISO, AATCC, Hunter),
	YI (ASTM D1925, ASTM 313),
	Metamerism index Mt,
	Staining Fastness, Color Fastness, Color Strength, Opacity,
	APHA/Hazen/Pt-Co (Platinum Cobalt Index), Gardner Index
	8° gloss, 555 color classification, haze (ASTM D1003), Saybolt (Sybert index), ASTM D1500 color scale, Chinese Pharmacopoeia color scale
Observer Angle	2°/10°
Illuminant	D65,A,C,D50,D55,D75,F1,F2,F3,F4,F5,F6,F7,F8,F9,F10,F11,F12,CWF,DLF,TL83,TL84,TPL5,U30
Displayed Data	Spectrogram/Values, Samples Chromaticity Values, Color Difference Values/Graph, PASS/FAIL Result, Color Offset
Measuring Time	About 2.4s (Measure SCI & SCE about 5s)
Repeatability	Spectral reflectance: Φ1mm/SCI, Standard deviation within 0.08%
	Chromaticity value:Φ1mm/SCI, Standard deviation within ΔE*ab 0.15 (After the instrument is warmed up and calibrated, measure the average value of the whiteboard 30 times at an interval of 5s)
	Spectral transmittance: Φ8mm/SCI, Standard deviation within 0.1%
	Chromaticity value:Φ8mm/SCI, Standard deviation within ΔE*ab 0.18(After the instrument is warmed up and calibrated, measure the average value of the whiteboard 30 times at an interval of 5s)
Inter-instrument Error	Φ1mm/SCI, Within ΔE*ab 0.25(Measured average value of 12 tiles of BCRA series Ⅱ)
Dimension	LWH=370x300x200mm
Weight	Approx. 9.6kg
Power	AC 24V, 3A Power adapter power supply
Illuminant Life Span	5 years, more than 3 million times measurements
Display	7-inch TFT color LCD, Capacitive Touch Screen
Data Port	USB, Bluetooth®5.0, print serial port
Data Storage	Standard 5000 Pcs, Sample 40000 Pcs(SCI/SCE counts as one piece of data)
Language	Simplified Chinese, Traditional Chinese, English, (German, French, Spanish can be customized)
Operating Environment	0~40℃（32~104°F）
Storage Environment	-20~50℃（-4~122°F）
Standard Accessory	Power adapter, manual, quality management software (download from official website), data cable, standard calibration board, black calibration box, transmission black baffle, sample holder, single reflection aperture, transmission test fixture assembly, single transmission test fixture assembly
Optional Accessory	Mini printer, instrument upside down test fixture, petri dish
Notes	The specifications are subject to change without notice.

12 Quality Inspection Processes

With 12 rigorous quality inspection processes in place, we ensure a high yield rate of up to 98% for batch processed precision parts.

DFM Analysis

Dimensional Tolerance

Material Testing

CNC Machining

FQC Detection

SPC / CPK

Problem Found

Problem Solving

OQC Detection

Surface Treatment

Full Inspection

Package

Our Valued Clients

FAQs About Spectrophotometer

SCI&SCE are two method in the color measurement. SCI means Specular Component Include,SCE means Specular Component Exclude.

Under the method of SCE, only test diffuse refection and exclude specular reflection. In that way, the test result is similar to object color was observed by human eyes.

Under the method SCI, both the diffuse refection and specular reflection will be included. In that way, the value about the color is more objective. It will not effect by the environment condition.

When we choose the instrument, those elements should be taking into consideration.

Yes. We can supply OEM and make customized design for any specific application. Our MOQ for OEM and ODM service is 5 pcs for one model. We can not only offer standard machines, but also customized machines. Don’t hesitate to tell us your requirement, we will try our best to meet your needs.

Who are we? Threnh Technology: 22-Year Professional Color Measurement Solution Provider

Threnh Technology is a Chinese professional Measurement Instrument manufacturer with 22 years of industry experience, specializing in the field of color measurement and surface gloss detection. Integrating research and development, design, production, marketing, and sales, the company takes technological innovation as its core and is committed to providing global customers with high-precision and intelligent testing instruments as well as professional solutions.

Yes, we can offer Spectrodensitometer quality certification issued by our lab free of charge, or issued by third-party international inspection Organizations with extra charge, please contact us for confirmation.

Yes, we warmly welcome and sincerely invite you or your team to visit our factory, we will help to arrange hotel and pick up you from airport.

Benchtop spectrophotometer TS8216